Tolerance synthesis scheme

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Corporate Author: National Institute of Standards and Technology (U.S.)
Other Authors: Roy, Utpal.
Format: Book Microform
Published:[Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2003]
Series:NISTIR ; 6836
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University of Illinois at Chicago

Location: Daley Library - Documents/3rd floor east

Call Number: C 13.58:;6836