Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing August 7-8, 2000, San Jose, California /

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Corporate Authors: IEEE International Workshop on Memory Technology, Design and Testing San Jose, Calif.) (Author)
IEEE Computer Society.

IEEE Computer Society. Technical Committee on VLSI.

IEEE Computer Society. Technical Council on Test Technology.

IEEE Solid-State Circuits Society.
Other Authors: Rajsuman, Rochit.
Wik, T.
Format: Book Electronic
Language:English
Published:Los Alamitos, Calif. : IEEE Computer Society, c2000.
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Online Access:http://HZ9PJ6FE4T.search.serialssolutions.com/?V=1.0&L=HZ9PJ6FE4T&S=JCs&C=TC0000395442&T=marc&tab=BOOKS Available only to UIC users
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University of Illinois at Chicago

Location: Electronic Collections

Call Number: TK7895.M4 I334 2000
Online Access:http://HZ9PJ6FE4T.search.serialssolutions.com/?V=1.0&L=HZ9PJ6FE4T&S=JCs&C=TC0000395442&T=marc&tab=BOOKS Available only to UIC users