Proceedings, FDTC 2008 : fault diagnosis and tolerance in cryptography : 10 August 2008, Washington, DC, USA /

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Corporate Author: Workshop on Fault Diagnosis and Tolerance in Cryptography Washington, D.C.)
Other Authors: Breveglieri, Luca.
Format: Book Electronic
Published:Los Alamitos, Calif. : IEEE Computer Society, ©2008.
Online Access:IEEE Xplore - Full text online 
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University of Illinois at Urbana-Champaign

Location: *UIUC Online Collection

Call Number: Online Resource
Notes: Accessible anywhere on campus or with UIUC NetID
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Online Access:IEEE Xplore - Full text online